Developments in quantitative convergent beam electron diffraction (CBED)

被引：0

作者：

Saunders, M ^{[1
]}

机构：

[1] Uppsala Univ, Angstrom Lab, Div Analyt Mat Phys, SE-75121 Uppsala, Sweden

来源：

MICROBEAM ANALYSIS 2000, PROCEEDINGS | 2000年 / 165期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：205 / 206

页数：2

共 50 条

[1] FURTHER DEVELOPMENTS IN THE ANALYSIS OF CONVERGENT BEAM ELECTRON-DIFFRACTION (CBED) DATA
STEEDS, JW
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (68): : 31 - 36
[2] Quantitative convergent beam electron diffraction (CBED) measurements of temperature factors in metals
Saunders, M
Fox, AG
ELECTRON MICROSCOPY AND ANALYSIS 1997, 1997, (153): : 145 - 148
[3] QUANTITATIVE COMPARISON OF CONVERGENT-BEAM ELECTRON-DIFFRACTION (CBED) PATTERNS
FAN, GY
ULTRAMICROSCOPY, 1988, 26 (1-2) : 71 - 76
[4] Quantitative convergent beam electron diffraction (CBED) studies of metals and intermetallic alloys
Saunders, M
Menon, ESK
Fox, AG
ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2, 1998, : 779 - 780
[5] SELECTED AREA ELECTRON-DIFFRACTION (SAED) AND CONVERGENT BEAM ELECTRON-DIFFRACTION (CBED)
STEEDS, JW
MORNIROLI, JP
REVIEWS IN MINERALOGY, 1992, 27 : 37 - 84
[6] Quantitative convergent beam electron diffraction
Arizona State Univ, Tempe, United States
Mater Trans JIM, 9 (938-946):
[7] Quantitative convergent beam electron diffraction
Zuo, JM
MATERIALS TRANSACTIONS JIM, 1998, 39 (09): : 938 - 946
[8] Quantitative convergent beam electron diffraction (CBED) measurements of low-order structure factors in metals
Saunders, M
Fox, AG
ELECTRON MICROSCOPY AND ANALYSIS 1997, 1997, (153): : 129 - 132
[9] DEVELOPMENTS IN CONVERGENT BEAM ELECTRON-DIFFRACTION
STEEDS, JW
VINCENT, R
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1983, 8 (06): : 419 - &
[10] CONVERGENT BEAM DIFFRACTION METHOD (CBED) IN ANALYTIC ELECTRON-MICROSCOPY (SURVEY)
YACHIKOV, IN
MAKSIMOV, SK
INDUSTRIAL LABORATORY, 1990, 56 (06): : 699 - 706

← 1 2 3 4 5 →