On-line testing of globally asynchronous circuits

被引：7

作者：

Shang, D ^{[1
]}

Bystrov, A ^{[1
]}

Yakovlev, A ^{[1
]}

Koppad, D ^{[1
]}

机构：

[1] Newcastle Univ, Sch EECE, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England

来源：

11TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM | 2005年

关键词：

D O I：

10.1109/IOLTS.2005.53

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The problem of on-line testing of asynchronous circuits is analysed, several infrastructures are proposed and a self-checking tree checker is designed. The checker uses on-demand self-test, which reduces power consumption and guarantees bounded self-test period. Objects under test are tested by observing protocols at their primary inputs and outputs. The checker does not slow down the functional system, as it only samples the signals. The protocols are checked by identifying enabled and refused signal transitions in each state of the system. The fault coverage of internal faults of the checker is calculated. Simulation results are included.

引用

页码：135 / 140

页数：6

共 50 条

[1] A Binary Decision Diagram Approach to On-line Testing of Asynchronous Circuits
Biswal, Pradeep Kumar
Biswas, Santosh
2019 32ND INTERNATIONAL CONFERENCE ON VLSI DESIGN AND 2019 18TH INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS (VLSID), 2019, : 94 - 99
[2] Off-line testing of asynchronous circuits
Koppad, D
Bystrov, A
Yakovlev, A
18TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: POWER AWARE DESIGN OF VLSI SYSTEMS, 2005, : 730 - 735
[3] On-line BIST for testing analog circuits
Velasco-Medina, J.
Rayane, I.
Nicolaidis, M.
Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors, 1999, : 330 - 332
[4] A Binary Decision Diagram Approach to On-line Testing of Asynchronous Circuits with Dynamic and Static C-elements
Biswal, Pradeep Kumar
Biswas, Santosh
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2019, 35 (05): : 715 - 727
[5] A Binary Decision Diagram Approach to On-line Testing of Asynchronous Circuits with Dynamic and Static C-elements
Pradeep Kumar Biswal
Santosh Biswas
Journal of Electronic Testing, 2019, 35 : 715 - 727
[6] A RESOURCE APPROACH TO ON-LINE TESTING OF COMPUTING CIRCUITS
Drozd, J.
Drozd, A.
Al-dhabi, M.
PROCEEDINGS OF 2015 IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS), 2015,
[7] Low cost on-line testing of RF circuits
Negreiros, M
Carro, L
Susin, AA
10TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS, 2004, : 73 - 78
[8] Recovery during concurrent on-line testing of identical circuits
Pomeranz, I
Reddy, SM
DFT 2005: 20TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, 2005, : 475 - 483
[9] On-line Testing for Differential Fault Attacks in Cryptographic Circuits
Mukhopadhyay, Debdeep
PROCEEDINGS OF THE 2013 IEEE 19TH INTERNATIONAL ON-LINE TESTING SYMPOSIUM (IOLTS), 2013, : 226 - 227
[10] ADOLT - An ADaptable On-Line Testing scheme for VLSI circuits
Maamar, A
Russell, G
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS, 1999, : 770 - 771

← 1 2 3 4 5 →