Noise Analysis of Non-Linear Dynamic Integrated Circuits

A time-domain methodology for noise analysis of non-linear dynamic integrated circuits with arbitrary excitations is presented. A non-stationary stochastic noise process is described as an Ito system of stochastic differential equations and a numerical solution for such a set of equations is found. Statistical simulation of specific circuits fabricated in 65 nm CMOS process shows that the proposed numerical methods offer accurate and efficient solution of stochastic differentials for noise analysis of integrated circuits.