Enhanced indirect-to-direct inter-valley scattering in germanium under tensile strain for improving the population of electrons in direct valley

被引:5
|
作者
Huang, Shi-Hao [1 ]
Zheng, Qi-Qiang [1 ]
Xie, Wen-Ming [1 ]
Lin, Jin-Yang [1 ]
Huang, Wei [2 ]
Li, Cheng [2 ]
Qi, Dong-Feng [3 ]
机构
[1] Fujian Univ Technol, Res Ctr Microelect Technol, Fuzhou 350118, Fujian, Peoples R China
[2] Xiamen Univ, Dept Phys, Xiamen 361005, Peoples R China
[3] Ningbo Univ, Lab Infrared Mat & Devices, Res Inst Adv Technol, Ningbo 315211, Zhejiang, Peoples R China
基金
中国国家自然科学基金;
关键词
strained germanium; inter-valley scattering; phonon engineering; electron transferring model; GE-ON-SI; LASER;
D O I
10.1088/1361-648X/aae50e
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A theoretical model is proposed to analyze the inter-valley electron transferring between direct Gamma and indirect L valleys, which sheds light on the electron conduction dynamics in (001) tensile strained Ge. Inter-valley scattering is included to calculate average scattering time between Gamma and L valleys based on a time-dependent Hamiltonian describing the electron-phonon interaction. Numerical results indicate that enhanced indirect-to-direct inter-valley scattering and reduced direct-to-indirect inter-valley scattering are reliable by introducing tensile strain in Ge material. The population ratio of electrons in Gamma and L valleys in strained Ge will increase one to two orders of magnitude compared to the model without the inter-valley scattering. The results offer fundamental understanding of phonon engineering for further improvement of performance in strained germanium light sources.
引用
收藏
页数:6
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