Fault diagnosis and logic debugging using Boolean satisfiability

被引:163
|
作者
Smith, A [1 ]
Veneris, A
Ali, MF
Viglas, A
机构
[1] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
[2] Univ Sydney, Sch Informat Technol, Sydney, NSW 2006, Australia
关键词
Boolean satisfiability debugging; design errors; diagnosis; faults; verification; VLSI;
D O I
10.1109/TCAD.2005.852031
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Recent advances in Boolean satisfiability have made it an attractive engine for solving many digital very-large-scale-integration design problems. Although useful in many stages of the design cycle, fault diagnosis and logic debugging have not been addressed within a satisfiability-based framework. This work proposes a novel Boolean satisfiability-based method for multiple-fault diagnosis and multiple-design-error diagnosis in combinational and sequential circuits. A number of heuristics are presented that keep the method memory and run-time efficient. An extensive suite of experiments on large circuits corrupted with different types of faults and errors confirm its robustness and practicality. They also suggest that satisfiability captures significant characteristics of the problem of diagnosis and encourage novel research in satisfiability-based diagnosis as a complementary process to design verification.
引用
收藏
页码:1606 / 1621
页数:16
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