High power 121.6 nm radiation source

被引:2
|
作者
Yan, JX [1 ]
Gupta, MC [1 ]
机构
[1] Old Dominion Univ, Coll Engn & Technol, Appl Res Ctr, Newport News, VA 23606 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2003年 / 21卷 / 06期
关键词
D O I
10.1116/1.1627801
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A high power 121.6 nm radiation source based on dielectric barrier discharge (DBD) has been developed. Lamp parameters such as gas pressure, discharge tube diameter, electrode area and gap were optimized to maximize the 121.6 nm radiation power.. Higher rf power was coupled to discharge by applying a flexible rf. network, which matched the impedance between the source and discharge. The discharge was optimized by simulation using XOOPIC software to model the lamp. The simulation results were in agreement with our experimental measurements. The stable, high power (8 W) radiation source was achieved and it could be used as a reliable source for lithography and other applications. (C) 2003 American Vacuum Society.
引用
收藏
页码:2839 / 2842
页数:4
相关论文
共 50 条
  • [1] 121.6 nm radiation source for advanced lithography
    Yan, JX
    El-Dakrouri, A
    Laroussi, M
    Gupta, MC
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (06): : 2574 - 2577
  • [2] Optimizing drive parameters of a nanosecond, repetitively pulsed microdischarge high power 121.6 nm source
    Stephens, J.
    Fierro, A.
    Trienekens, D.
    Dickens, J.
    Neuber, A.
    PLASMA SOURCES SCIENCE & TECHNOLOGY, 2015, 24 (01):
  • [3] Coatings with high 102.6-to-121.6 nm reflectance ratio
    Rodriguez-de Marcos, Luis
    Larruquert, Juan I.
    Mendez, Jose A.
    Aznarez, Jose A.
    Vidal-Dasilva, Manuela
    Garcia-Cortes, Sergio
    SPACE TELESCOPES AND INSTRUMENTATION 2012: ULTRAVIOLET TO GAMMA RAY, 2012, 8443
  • [4] Study on High Reflective Film in 121.6 nm Far Ultraviolet
    Wang Jinyan
    Zhang Jinlong
    Jiao Hongfei
    Cheng Xinbin
    ACTA OPTICA SINICA, 2020, 40 (09)
  • [5] High average power radiation source (λ = 13.5 nm) for next-generation lithography
    Borisov, V.M.
    Vinokhodov, A.Yu.
    Kiryukhin, Yu.B.
    Ivanov, A.S.
    Mishchenko, V.A.
    Prokof'ev, A.V.
    Khristoforov, O.B.
    Izvestiya Akademii Nauk. Ser. Fizicheskaya, 2004, 68 (04): : 503 - 509
  • [6] Propyne and allene photolysis at 193.3 nm and at 121.6 nm
    Qadiri, RH
    Feltham, EJ
    Nahler, NH
    García, RP
    Ashfold, MNR
    JOURNAL OF CHEMICAL PHYSICS, 2003, 119 (24): : 12842 - 12851
  • [7] A high power THz radiation source
    Guang, C
    Oz, E
    Muggli, P
    Narang, R
    Filip, CV
    Tochitsky, S
    Clayton, CE
    Marsh, KA
    Mori, WB
    Joshi, C
    Yoder, RB
    Rosenzweig, J
    Katsouleas, TC
    TWENTY SEVENTH INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES, CONFERENCE DIGEST, 2002, : 17 - 18
  • [8] Polarizing and non-polarizing mirrors for the hydrogen Lyman-α radiation at 121.6 nm
    Bridou, F.
    Cuniot-Ponsard, M.
    Desvignes, J. -M.
    Gottwald, A.
    Kroth, U.
    Richter, M.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2011, 102 (03): : 641 - 649
  • [9] Polarizing and non-polarizing mirrors for the hydrogen Lyman-α radiation at 121.6 nm
    F. Bridou
    M. Cuniot-Ponsard
    J.-M. Desvignes
    A. Gottwald
    U. Kroth
    M. Richter
    Applied Physics A, 2011, 102 : 641 - 649
  • [10] Photodissociation of methane at Lyman alpha (121.6 nm)
    Park, Jaehong
    Lee, Jungwoo
    Sim, Kijo
    Han, Jin Wook
    Yi, Whikun
    BULLETIN OF THE KOREAN CHEMICAL SOCIETY, 2008, 29 (01): : 177 - 180