A CMOS sensor optimized for laser spot-position detection

被引：12
|
作者：
De Nisi, F [1 ]
Comper, F
Gonzo, L
Gottardi, M
Stoppa, D
Simoni, A
Beraldin, JA
机构：
[1] IRST, ITC, Ctr Sci & Technol Res, I-38050 Trento, Italy
[2] Natl Res Council Canada, Inst Informat Technol, Ottawa, ON K1A 0R6, Canada
来源：
IEEE SENSORS JOURNAL | 2005年 / 5卷 / 06期
关键词：
three-dimensional (3-D) imaging; flying-spot active triangulation; optical sensor;
D O I：
10.1109/JSEN.2005.859217
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An optical sensor architecture optimized for flying-spot, triangulation-based, three-dimensional (3-D) laser scanners will be presented. The architecture implements a spot-position detection algorithm based on a two-step procedure that allows for improved dynamic range and readout speed. The sensor, which contains two linear arrays of pixels, analog readout channels, and digital signal preprocessing circuitry, has been fabricated in 0.6-mu m CMOS double-poly triple-metal technology and measures 8.17 x 5.67 mm(2). Pixel, size and shape have been selected for reducing the effect of laser speckle and for the possibility of measuring color in a multiwavelength 3-D scanner. Electrooptical test results confirm the sensor behavior as expected from simulations on a dynamic range of 80 dB and exhibits a maximum speed of 50-k voxel/s.
引用
收藏
页码：1296 / 1304
页数：9
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