Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors

被引：2

作者：

Makeev, Mstislav ^{[1
]}

Meshkov, Sergey ^{[1
]}

Sinyakin, Vladimir ^{[1
]}

机构：

[1] Bauman Moscow State Tech Univ, Moscow 105005, Russia

来源：

INTERNATIONAL CONFERENCE ON MODERN TRENDS IN MANUFACTURING TECHNOLOGIES AND EQUIPMENT (ICMTMTE 2017) | 2017年 / 129卷

关键词：

D O I：

10.1051/matecconf/201712903019

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The problems of technical diagnostics of electronic nanoobjects and devices based on them are considered. Algorithms for constructing the operability and reliability prediction fields of electronic nanoobjects and devices based on them in the specified operation conditions are given.

引用

页数：4

共 5 条

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