System-in-Package (SiP) design: Issues, approaches and solutions

被引:0
|
作者
Leung, L. L. W. [1 ]
Sham, M. L. [1 ]
Ma, W. [1 ]
Chen, Y. C. [1 ]
Lin, J. R. [1 ]
Chung, T. [1 ]
机构
[1] Hong Kong Appl Sci & Technol Res Inst, APDCoE, Shatin, Hong Kong, Peoples R China
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
With an increasing demand of low-cost, small-size, high-performance and multi-function portable and wireless applications, System-in-Package (SiP), which provides various advantages including shorter time-to-market, better performance and lower cost and allows a combination of the multiple semiconductor technologies, such as silicon (Si), silicon germanium (SiGe), gallium arsenide (GaAs), has aroused a lot of interest from both industries and academia. With the emergence and breakthrough of certain critical assembly and substrate technologies, SiP technologies become promising solutions for today's short life-cycle consumer electronic products. However, in order to timely deliver a first-pass SiP product and achieve the above mentioned advantages offered by SiP: small-size, low-cost and high-performance, careful and concurrent design in both electrical and thermo-mechanical aspects through skillful modeling, accurate and efficient simulation is needed. Trade-off among multi-disciplinary performance constraints, manufacturability and cost is a must as well. In this paper, we address the issues, technical challenges, approaches and solutions including inter-disciplinary performance constraints, signal integrity, testability, etc., of designing different types of low-cost and high-yield SiP modules: digital, analog and mixed-signal. Examples covering techniques, methodologies and technologies utilized in designing different types of SiP modules, including electromagnetic (EM) simulation for signal integrity analysis, thermo-mechanical simulation for high-power devices and different substrate technologies will be provided.
引用
收藏
页码:772 / 776
页数:5
相关论文
共 50 条
  • [1] System design issues for 3D system-in-package (SiP)
    Miettinen, J
    Mäntysalo, M
    Kaija, K
    Ristolainen, EO
    54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2004, : 610 - 615
  • [2] Interconnection modeling challenges in system-in-package (SiP) design
    Castorina, S.
    Ene, R. A.
    SCIENTIFIC COMPUTING IN ELECTRICAL ENGINEERING, 2006, 9 : 413 - +
  • [3] The reliability issues on ASIC/memory integration by SiP (System-in-Package) technology
    Song, YH
    Kim, SG
    Rhee, KJ
    Cho, DS
    Kim, TS
    IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS, 2003, : 7 - 10
  • [4] Electrical Design and Characterization of Si Interposer for System-in-Package (SiP)
    Kato, Shinobu
    Tango, Tomoyuki
    Hasegawa, Kiyohisa
    Bhandari, Ramesh K.
    Sakai, Atsushi
    Segawa, Hiroshi
    Kariya, Takashi
    Sudo, Toshio
    2009 IEEE 59TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, VOLS 1-4, 2009, : 1648 - +
  • [5] Design and process of 3D MEMS system-in-package (SiP)
    Lau J.H.
    Journal of Microelectronics and Electronic Packaging, 2010, 7 (01): : 10 - 15
  • [6] New System-in-Package (SiP) Integration Technologies
    Yu, Doug C. H.
    2014 IEEE PROCEEDINGS OF THE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 2014,
  • [7] Challenges and opportunities in System-in-Package (SiP) business
    Sham, M. L.
    Chen, Y. C.
    Leung, T. W.
    Lin, J. R.
    Chung, T.
    ICEPT: 2006 7TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2006, : 26 - +
  • [8] System-in-Package (SiP) modules for wireless multiradio
    Martin, Nigel
    Pohjonen, Helena
    56TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE 2006, VOL 1 AND 2, PROCEEDINGS, 2006, : 1347 - +
  • [9] A study of considering the reliability issues on ASIC/memory integration by SIP (system-in-package) technology
    Song, YH
    Kim, SG
    Lee, SB
    Rhee, KJ
    Kim, TS
    MICROELECTRONICS RELIABILITY, 2003, 43 (9-11) : 1405 - 1410
  • [10] Solder Attributes Paste for System-in-Package (SiP) Assembly
    Lim, Sze Pei
    Thum, Kenneth
    Mackie, Andy C.
    Advancing Microelectronics, 2021, 48 (02): : 34 - 39