Contact System of Solid State Surface Mapping

被引：0
|
作者：
Hiklova, Helena [1 ]
Havelkova, Martina [1 ]
Chmelickova, Hana [1 ]
Lapsanska, Hana [1 ]
机构：
[1] Acad Sci Czech Republic, Inst Phys, Joint Lab Opt, Olomouc 77207, Czech Republic
来源：
PROCEEDINGS OF THE 48TH INTERNATIONAL SCIENTIFIC CONFERENCE ON EXPERIMENTALNI ANALYZA NAPETI 2010 EXPERIMENTAL STRESS ANALYSIS | 2010年
关键词：
Contact sensing; contact profilometer; 3D imaging of solid surfaces;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
The advantages of contact solid state surface mapping are reminded in this paper. Some possibilities are demonstrated by several examples. These examples include measuring of laser beam treated silicon surface and mapping of laser cuts in metal sheets.
引用
收藏
页码：89 / 93
页数：5
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