Study of thermoelectric performance and intrinsic defect of promising n-type half-Heusler FeGeW

被引:0
|
作者
Xu, Yazhu [1 ]
Sun, Jianmin [1 ]
Jian, Miaomiao [1 ]
Ye, Xianfeng [1 ]
Zhao, Gaofeng [1 ]
Feng, Zhenzhen [1 ,2 ]
机构
[1] Henan Univ, Inst Computat Mat Sci, Sch Phys & Elect, Int Joint Res Lab New Energy Mat & Devices Henan, Kaifeng 475004, Peoples R China
[2] Henan Univ, Joint Ctr Theoret Phys, Sch Phys & Elect, Kaifeng 475004, Peoples R China
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
thermoelectric material; half-Heusler; intrinsic defect; n-type; TEMPERATURE; DISCOVERY; BANDS;
D O I
10.1088/1361-6463/ac8434
中图分类号
O59 [应用物理学];
学科分类号
摘要
Half-Heusler (HH) compounds are considered promising thermoelectric materials for high-temperature power generation due to their good electrical properties and thermal stability. Some new HHs with excellent thermoelectric properties are found to be p-type, the discovery of competitive n-type HH materials has been extremely challenging. Here, we report a new HH compound FeGeW through first-principles calculation, which exhibits a high ZT of 2.36 at 1000 K. Systematically studied its thermoelectric performance indicates that a large dispersion or small band effective mass of conduction band can efficiently improve the electrical conductivity of n-type FeGeW. From the calculated formation energy of intrinsic point defects, we find that positive charged Fe interstitial are found to be the dominant defect at Fe-rich/Ge-poor condition, which account for the n-type conduction. Moreover the transition levels of Fe interstitial defect is shallow, which means that this donor defect does not damage electrical conductivity and thermoelectric performance. These results not only find a new n-type HH compound FeGeW, but also are helpful for understanding the roles of point defects in FeGeW, which is expected to encourage more experimental and theoretical investigations to study this kind of n-type HH thermoelectric material and seek out strategies to optimize thermoelectric performance using intrinsic point defect.
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页数:10
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