Combining Results of Accelerated Radiation Tests and Fault Injections to Predict the Error Rate of an Application Implemented in SRAM-Based FPGAs

被引：31

作者：

Velazco, Raoul ^{[1
]}

Foucard, Gilles ^{[1
]}

Peronnard, Paul ^{[1
]}

机构：

[1] Lab Tech Informat & Microelect Architecture Syst, F-38031 Grenoble, France

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2010年 / 57卷 / 06期

关键词：

Accelerated testing; fault injection; fault tolerance; field-programmable gate arrays (FPGAs); single-event rates; single-event upsets SEUs); space applications;

D O I：

10.1109/TNS.2010.2087355

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An approach combining the SRAM-based field-programmable gate array static cross-section with the results of fault injection campaigns allows predicting the error rate of any implemented application. Experimental results issued from heavy ion tests are compared with predictions to validate the proposed methodology.

引用

页码：3500 / 3505

页数：6

共 24 条

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