The strict method to numerically solve the diffraction problem for a three-dimensional structure

被引：0

作者：

Knishevskaya, L ^{[1
]}

Tamoshiunas, V ^{[1
]}

Smertin, O ^{[1
]}

Tamoshiuniene, M ^{[1
]}

Shugurov, V ^{[1
]}

机构：

[1] Lithuania Acad Sci, Inst Semicond Phys, LT-2600 Vilnius, Lithuania

来源：

MILLIMETER AND SUBMILLIMETER WAVES IV | 1998年 / 3465卷

关键词：

strict method; computation; three-dimensional structure; electromagnetic; sensor; probe; reflector; microstrip; scattering; semiconductor;

D O I：

10.1117/12.331201

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The integral equations' method proposed in this paper enables one to rigorously solve Maxwell equations for 3D-structures of arbitrary geometrical shape in case of any incident wave. The electromagnetic fields of the reflected and transmitted waves have been found for some new structures. One of them is the semiconductor sensor to detect a microwave electric field. The sensor is constructed as a vibrator made of two microstrip conductors with a semiconductor sample of cuboid form placed between them.

引用

页码：478 / 482

页数：3

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