Study on the mechanism of super-resolution near-field structure high-density optical data storage

被引：5
|
作者：
Sun, LQ [1 ]
Wang, J [1 ]
Zhang, EY [1 ]
Tian, Q [1 ]
机构：
[1] Tsing Hua Univ, Dept Precis Instruments, State Key Lab Precis Measurement Technol & Instru, Beijing 100084, Peoples R China
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2003年 / 42卷 / 08期
关键词：
near-field optics; super-resolution near-field structure; optical data storage; evanescent wave; surface plasmon waves; surface plasmon resonances;
D O I：
10.1143/JJAP.42.5113
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The super-resolution near-field structure (Super-RENS), glass/SiN/Sb/SiN, which is promising for near-field ultrahigh-density optical data storage (ODS), has been proposed and investigated in recent years. The recording mark size is a few tens of nanometers, far beyond the diffraction limit of traditional optics. The mechanism of this Super-RENS, including the working principle of the nonlinear optical layers and the size reduction of the recording marks, has not been clearly understood. In this study, the action of sandwich multilayer films in Super-RENS is mainly investigated. The behavior of the optical wave at the boundary between two dielectric media is discussed in detail, and the resonance characteristic of the surface plasmon wave (SPW) is analyzed. The mechanism of ultrahigh-density ODS using Super-RENS is explained quantitatively. It is demonstrated that the wave effect is larger than the thermal effect in Super-RENS.
引用
收藏
页码：5113 / 5116
页数：4
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