NANOMETROLOGY AND FEATURES OF METROLOGICAL ASSURANCE OF MEASUREMENTS OF THE ROUGHNESS AND RELIEF PARAMETERS OF NANOSTRUCTURED SURFACES

被引:0
|
作者
Lysenko, V. G. [1 ]
Soloviov, V. V. [1 ]
Luskinovich, P. N. [1 ]
Zolotarevskii, S. Yu. [1 ]
Gubskii, K. L. [1 ]
机构
[1] All Russia Res Inst Metrol Serv VNIIMS, Moscow, Russia
关键词
nanometrology; scanning probe microscopy; resolution; calibration;
D O I
10.1007/s11018-011-9644-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Questions related to metrological assurance of measurements of the roughness and relief parameters of nanostructured surfaces are considered. On the basis of an analysis of current developments in the area of scanning probe microscopy, a description of the physical and technical characteristics of different types of instruments for measurements in the nanodimensional range is given and the traceability of these characteristics to standards of the unit of length is demonstrated.
引用
收藏
页码:1215 / 1221
页数:7
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