Frictional Properties of a Mesoscopic Contact with Engineered Surface Roughness

被引:16
|
作者
Sondhauss, Johannes [1 ,2 ]
Fuchs, Harald [1 ,2 ]
Schirmeisen, Andre [3 ]
机构
[1] Ctr Nanotechnol CeNTech, D-48149 Munster, Germany
[2] Univ Munster, Inst Phys, D-48149 Munster, Germany
[3] Univ Giessen, Inst Appl Phys, D-35392 Giessen, Germany
关键词
Unlubricated friction; Silicon; Titanium; AFM; Surface roughness; Focused ion beam; ATOMIC-FORCE MICROSCOPY; FOCUSED ION-BEAMS; PULL-OFF FORCES; QUANTITATIVE-ANALYSIS; SCALE FRICTION;
D O I
10.1007/s11249-011-9776-8
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
Friction between titanium spheres and an artificially structured silicon surface was measured with a friction force microscope. Two spheres with radii of 2.3 mu m and 7.9 mu m were firmly glued to the tip of the microscope cantilever. A periodic stripe pattern with a groove depth of 26 nm and systematically increasing groove width from 500 nm to 3500 nm was fabricated from a silicon wafer with a focused ion beam. The sphere substrate friction coefficient shows a strong enhancement at a certain groove periodicity, which is related to geometrical interlocking of the two surfaces. This shows that careful modification of the surface roughness can help to control the tribological behavior of mesoscale contacts.
引用
收藏
页码:319 / 324
页数:6
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