Panel LM unit-root tests with level shifts

被引:248
作者
Im, KS [1 ]
Lee, J
Tieslau, M
机构
[1] Univ Cent Florida, Dept Econ, Orlando, FL 32816 USA
[2] Univ Alabama, Dept Econ Finance & Legal Studies, Tuscaloosa, AL USA
[3] Univ N Texas, Dept Econ, Denton, TX 76203 USA
关键词
D O I
10.1111/j.1468-0084.2005.00125.x
中图分类号
F [经济];
学科分类号
02 ;
摘要
This paper proposes a new panel unit-root test based on the Lagrangian multiplier (LM) principle. We show that the asymptotic distribution of the new panel LM test is not affected by the presence of structural shifts. This result holds under a mild condition that N/T --> k, where k is any finite constant. Our simulation study shows that the panel LM unit-root test is not only robust to the presence of structural shifts, but is more powerful than the popular Im, Pesaran and Shin (IPS) test. We apply our new test to the purchasing power parity (PPP) hypothesis and find strong evidence for PPP.
引用
收藏
页码:393 / 419
页数:27
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