Micro-features measurement using meso-volume CMM

被引:2
|
作者
Wozniak, A. [1 ]
Mayer, J. R. R. [2 ]
机构
[1] Warsaw Univ Technol, Inst Metrol & Measuring Syst, Sw A Boboli 8 St, PL-02525 Warsaw, Poland
[2] Ecole Polytech Montreal, Dept Genie Mecan, Montreal, PQ, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
D O I
10.1007/978-3-540-73956-2_122
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Paper will discuss an understanding for the compensation of the probe ball radius in a scanning process of micro-features. As will be shown, the indigenous CMM software does not always adequately compensate the stylus tip radius. As a result, the information about the real shape of the measured features can be distorted. In order to accurately measure precise geometric features, and in particular micro-features, a new algorithm for the compensation of the stylus tip radius in a CMM scanning process will be proposed. To demonstrate the performance of the indigenous CMM software as well as feasibilities of our new algorithm, we will show the results of measurements of the profiles of precise micro-feature such as silicon micro-grove. Tests will be carrying out on a fixed bridge, moving-table Mitutoyo LEGEX 910 CMM equipped with a MPP-300 scanning probe and also on a Zeiss ACCURA CMM equipped with a VAST GOLD scanning probe.
引用
收藏
页码:621 / +
页数:2
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