Monte Carlo simulation of kinetic electron emission induced by MeV He+ and He++ ions incident on polycrystalline aluminium

被引：13
|
作者：
Dubus, A
Rösler, M
Benka, O
机构：
[1] Free Univ Brussels, Serv Metrol Nucl, B-1050 Brussels, Belgium
[2] Hahn Meitner Inst Berlin GmbH, D-14109 Berlin, Germany
[3] Johannes Kepler Univ, Inst Phys Expt, A-4040 Linz, Austria
来源：
MATHEMATICS AND COMPUTERS IN SIMULATION | 2001年 / 55卷 / 1-3期
关键词：
particle induced electron emission; Monte Carlo simulation;
D O I：
10.1016/S0378-4754(00)00244-5
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
A theoretical study of the characteristics of kinetic electron emission induced by He+ and He++ ions (in the MeV-range) incident on polycrystalline aluminium targets is presented in this paper. The models of interactions for the incident projectiles as well as for the excited electrons are described. Especially, the electron excitation induced by incident Het is calculated by taking into account the structure of the composite projectile. Charge exchange processes by the projectiles are also considered. The subsequent electron transport and escape is calculated by means of a Monte Carlo simulation code. The calculated electron emission yield is compared to experimental results. The differences between He+ and He++ are discussed, the role of the electron lost by He+ being especially emphasised. (C) 2001 IMACS. Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码：37 / 48
页数：12
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