A Deep Neural Network Guided Testing Approach for Finite State Machines

被引:0
|
作者
Rahaman, Habibur [1 ]
Chattopadhyay, Santanu [2 ]
Sengupta, Indranil [1 ]
机构
[1] IIT, Comp Sci & Engn, Kharagpur, W Bengal, India
[2] IIT, Elect & Elec Comm Engn, Kharagpur, W Bengal, India
关键词
FSM; fault detection; conformance testing; DNN; TEST-GENERATION;
D O I
10.1109/ISDCS52006.2021.9397900
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Finite-State Machines (FSMs) lie at the heart of every digital system and verifying whether a given circuit implementation (B) of an FSM (A) conforms to its specification is an important task in the design cycle. In this work, a deep neural network (DNN) based technique for testing FSMs is developed. Given a set of transition functions that specify an FSM, a DNN is trained with the input-output sequences using the back-propagation algorithm. First, the input sequences and the corresponding output sequences (I/O-pairs) for A are constructed, and some of them are utilized to train the DNN. After training, the proposed DNN is validated with the rest of the I/O-pairs. Once the training and validation of the DNN is completed, it can be used for checking the correctness of its implementation (B) very quickly. Some inputs are applied to B and the observed output sequences are compared with those predicted by the proposed DNN. Based on the similarities between them, B is either declared as correct implementation of A, else it is declared as faulty implementation. The experiments are performed on the MCNC FSM benchmarks and certain faults are injected to form mutant FSMs. Experimental results reveal the efficacy of the proposed technique. Only a few tests are required to detect the presence of anomaly, if any. Hence, the test time is very less resulting in an average test time reduction of 85.66% compared to existing method. It is observed from the earlier works that this type of DNN based FSM testing method is presented first time.
引用
收藏
页数:6
相关论文
共 50 条
  • [1] Conformance Testing for Finite State Machines Guided by Deep Neural Network
    Rahaman, Habibur
    Chattopadhyay, Santanu
    Sengupta, Indranil
    JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, 2022, 31 (09)
  • [2] Conformance testing of protocols specified as communicating finite state machines - A guided random walk based approach
    Lee, D
    Sabnani, KK
    Kristol, DM
    Paul, S
    IEEE TRANSACTIONS ON COMMUNICATIONS, 1996, 44 (05) : 631 - 640
  • [3] Learning a class of large finite state machines with a recurrent neural network
    Giles, CL
    Horne, BG
    Lin, T
    NEURAL NETWORKS, 1995, 8 (09) : 1359 - 1365
  • [4] Bounds on the complexity of recurrent neural network implementations of finite state machines
    Horne, BG
    Hush, DR
    NEURAL NETWORKS, 1996, 9 (02) : 243 - 252
  • [5] Bounds on the complexity of recurrent neural network implementations of finite state machines
    NEC Research Institute, 4 Independence Way, Princeton, NJ 08540, United States
    NEURAL NETW., 2 (243-252):
  • [6] Stochastic testing of finite state machines
    Hadjicostis, CN
    PROCEEDINGS OF THE 2001 AMERICAN CONTROL CONFERENCE, VOLS 1-6, 2001, : 4568 - 4573
  • [7] Incremental testing of finite state machines
    Chaves Pedrosa, Lehilton Lelis
    Moura, Arnaldo Vieira
    SOFTWARE TESTING VERIFICATION & RELIABILITY, 2013, 23 (08): : 585 - 612
  • [8] A practical approach for testing timed deterministic finite state machines with single clock
    El-Fakih, Khaled
    Yevtushenko, Nina
    Simao, Adenilso
    SCIENCE OF COMPUTER PROGRAMMING, 2014, 80 : 343 - 355
  • [9] Testing as collecting of evidence: An integrated approach to test generation for finite state machines
    Kapus-Kolar, Monika
    COMPUTER JOURNAL, 2007, 50 (03): : 315 - 331
  • [10] Mutation Analysis for Testing Finite State Machines
    Li, Jin-hua
    Dai, Geng-xin
    Li, Huan-huan
    PROCEEDINGS OF THE SECOND INTERNATIONAL SYMPOSIUM ON ELECTRONIC COMMERCE AND SECURITY, VOL I, 2009, : 620 - +