Slurry sampling electrothermal vaporization combined with ICP-AES for direct analysis of environmental samples

In this article, a polytetrafluoroethylene (PTFE) slurry was used as a chemical modifier for direct determination of trace elements in environmental samples by electrothermal vaporization inductively coupled plasma atomic emission spectrometry (ETV-ICP-AES) with slurry sampling. The vaporization behaviors of the analytes in slurry and solution were comparatively studied in the presence of PTFE. The main influence factors for this method were examined. Under the optimum operating conditions, the precision of this method was better than 7% with the detection limits varying from 1.7 ng mL(-1) (Cu) to 203 ng mL(-1) (Zn). The proposed method has been applied to the direct determination of the trace elements in camphor tree leaves and standard reference material (the combined sample of branch and leaf of shrub, GBW 07603) with satisfactory results.