Threshold photoionization at high resolution.

被引：0
|
作者：
Merkt, F [1 ]
Osterwalder, A [1 ]
Hollenstein, U [1 ]
Seiler, R [1 ]
Sommavilla, M [1 ]
机构：
[1] ETH Zurich, Dept Chem, CH-8092 Zurich, Switzerland
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2001年 / 221卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
41-PHYS
引用
收藏
页码：U233 / U233
页数：1
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