Commentary: Inference in simple step-stress models

被引：16
|
作者：
Watkins, AJ [1 ]
机构：
[1] Univ Wales, EBMS, Swansea SA2 8PP, W Glam, Wales
来源：
IEEE TRANSACTIONS ON RELIABILITY | 2001年 / 50卷 / 01期
关键词：
accelerated life testing; exponential distribution; lack of memory; step-stress; type-II censoring;
D O I：
10.1109/24.935014
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：36 / 37
页数：2
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