Effects of conducted electromagnetic interference on analogue-to-digital converter

被引：6
|
作者：
Wan, F. [1 ]
Duval, F. [1 ]
Savatier, X. [1 ]
Louis, A. [1 ]
Mazari, B. [1 ]
机构：
[1] ESIGELEC, IRSEEM, St Etienne, France
来源：
ELECTRONICS LETTERS | 2011年 / 47卷 / 01期
关键词：
D O I：
10.1049/el.2010.2988
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The effects of conducted electromagnetic interference on an analogue-to-digital converter (ADC) are presented by the measurement. The measurement results reveal that the DC shift behaviour of the output conversion is caused by the continuous-wave interference. The DC shift behaviour produces a novel failure criterion for the immunity measurement of the ADC.
引用
收藏
页码：23 / U40
页数：2
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