More accurate breakdown voltage estimation for the new step-up test method

被引:6
|
作者
Hirose, H [1 ]
机构
[1] Kyushu Inst Technol, Dept Control & Engn Sci, Fac Comp Sci & Syst Engn, Iizuka, Fukuoka 8208502, Japan
关键词
Impulse breakdown voltage; nominal breakdown voltage; stepup test method; optimal test; electrical insulation; normal distribution;
D O I
10.1109/TDEI.2003.1207475
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The step-up method is used to estimate the impulse breakdown voltages when the electrical insulation is not usable after it is broken. This paper analyses the reliability of the estimates of the underlying breakdown probability distribution in the step-up method, when (1) the observed breakdown voltage itself is available and (2) it is not available. The former case has many advantages compared to the latter case such that (i) the confidence intervals of the estimates become smaller and (ii) the estimates can be obtained with higher probability. Consequently, this paper recommends using the estimates of the underlying distribution for the breakdown voltages instead of the nominal breakdown voltages. Some illustrative examples are given.
引用
收藏
页码:475 / 482
页数:8
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