Research of a microplasma breakdown in thin films of glassy semiconductors

被引：0
|
作者：
Fairushin, AR [1 ]
机构：
[1] Moscow Power Engn Inst, Semicond Elect Chair, Moscow, Russia
来源：
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2001年 / 3卷 / 02期
关键词：
plasma; chalcogenide; streamer; oscillation; breakdown;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Experiments were carried out to detect presence of a microplasma in thin films of glassy chalcogenide semiconductors. Films of As2Se3 and As2SeTe2 were investigated. In the regime of a "soft" breakdown time series of current and voltage of the samples based on As2Se3 were measured and then processed by spectral analysis. Films of As2SeTe2 were used for experiment with long discharge space. This experiment resulted in observation of oscillating streamer discharge. A model was suggested to explain the phenomenon.
引用
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页码：499 / 502
页数：4
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