X-ray analysis of the Cd0.5Ge0.5Cr2Se4 and CdCr1.9Ge0.075Se4 compounds

被引：0
|
作者：
Maciazek, Ewa [1 ]
Goryczka, Tomasz [2 ]
Jendrzejewska, Izabela [1 ]
机构：
[1] Silesian Univ, Inst Chem, Szkolna 9, PL-40006 Katowice, Poland
[2] Silesian Univ, Inst Mat Sci, PL-40006 Katowice, Poland
来源：
APPLIED CRYSTALLOGRAPHY XX | 2007年 / 130卷
关键词：
spinel; Rietveld refinement; X-ray-diffraction; ceramic method;
D O I：
10.4028/www.scientific.net/SSP.130.93
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
The polycrystalline Cd(0.5)Geo(0.5)Cr(2)Se(4) and CdCr1.9Ge0.075Se4 compounds were obtained using ceramic method. X-ray analysis was used to make phase and structure analysis. The Rietveld method was applied for structure refinement. Both compounds crystallized in cubic, normal spinel structure, Fd (3) over barm. Besides the main spinel phase, Cr2Se3 was observed.
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页码：93 / +
页数：2
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