Energy-filtered TEM with the integrated imaging filter

被引：0
|
作者：
Nadarzinski, K [1 ]
de Jong, AF [1 ]
Kundmann, MK [1 ]
Kothleitner, G [1 ]
机构：
[1] Philips Electron Opt BV, NL-5600 MD Eindhoven, Netherlands
来源：
ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION | 1998年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：243 / 244
页数：2
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