Industrial View of III-V Devices Compact Modeling for Circuit Design

被引:9
|
作者
Zampardi, Peter J. [1 ]
Kharabi, Faramarz [2 ]
机构
[1] Qorvo, Newbury Pk, CA 91320 USA
[2] Qorvo, Greensboro, NC 27409 USA
关键词
HEMTs; heterojunction bipolar transistor; integrated circuit modeling; semiconductor device modeling; GAAS; TECHNOLOGY;
D O I
10.1109/TED.2018.2884153
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a commercial or industrial view of III-V compact models for circuit design. We contrast the requirements of III-V modeling to those of silicon. The differences in requirements are strongly rooted in the applications that III-V devices are used in the end user of III-V models and the differences in the "ecosystems" of the technologies. These differences create both challenges and opportunity for the III-V modeling community.
引用
收藏
页码:28 / 33
页数:6
相关论文
共 50 条
  • [1] Compact Modeling of III-V/Si FETs
    Zhou, Xing
    Ben Chiah, Siau
    Syamal, Binit
    Ajaykumar, Arjun
    Liu, Xu
    Zhou, Hongtao
    2014 12TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2014,
  • [2] Monolithic III-V/CMOS Co-integrated Technology, Scalable Compact Modeling, and Hybrid Circuit Design
    Zhou, Xing
    Chiah, Siau Ben
    2018 14TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2018, : 848 - 851
  • [3] Impact of III-V and Ge Devices on Circuit Performance
    Park, Jeongha
    Oh, Saeroonter
    Kim, SoYoung
    Wong, H. -S. Philip
    Wong, S. Simon
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2013, 21 (07) : 1189 - 1200
  • [4] MODELING OF III-V SEMICONDUCTOR-DEVICES
    SNOWDEN, CM
    JOURNAL OF THE INSTITUTION OF ELECTRONIC AND RADIO ENGINEERS, 1987, 57 (01): : S51 - S61
  • [5] Modeling and simulation enhanced mobility and III-V devices
    University of Massachusetts
    不详
    Tech. Dig. Int. Electron Meet. IEDM, 2008,
  • [6] An innovative and integrated approach to III-V circuit design
    Yang, Y.
    Zampardi, P.
    Fredriksson, M.
    Xu, J.
    Chen, S.
    Zhang, G.
    Sifri, J.
    MICROWAVE JOURNAL, 2008, 51 (09) : 136 - +
  • [7] Current Trends and Challenges in III-V HBT Compact Modeling
    Rudolph, Matthias
    2008 EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC), 2008, : 278 - 281
  • [8] Modeling and Analysis of III-V Logic FETs for Devices and Circuits: Sub-22nm Technology III-V SRAM Cell Design
    Oh, Saeroonter
    Park, Jeongha
    Wong, S. Simon
    Wong, H. -S. Philip
    PROCEEDINGS OF THE ELEVENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2010), 2010, : 342 - 346
  • [9] III-V OPTOELECTRONIC DEVICES
    KRESSEL, H
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (03) : C94 - C94
  • [10] An industrial view on compact modeling
    Woltjer, Reinout
    Tiemeijer, Luuk
    Klaassen, Dick
    ESSDERC 2006: PROCEEDINGS OF THE 36TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE, 2006, : 41 - +