Electromagnetic compatibility of electronic equipment - Review of testing methods

被引：0
|
作者：
Bem, DJ [1 ]
Wieckowski, TW [1 ]
机构：
[1] Wroclaw Tech Univ, Inst Telecommun & Acoust, PL-50370 Wroclaw, Poland
来源：
MIKON-98: 12TH INTERNATIONAL CONFERENCE ON MICROWAVES & RADAR, VOLS 1-4 | 1998年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper presents a direct and an indirect method by which the electromagnetic compatibility of electronic equipment can be tested. Most of the tests were run at the EMC Laboratory;, Institute of Telecommunication and Acoustics, Wroclaw University of Technology.
引用
收藏
页码：A17 / A35
页数：19
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