Long-term Stability of Lithium Niobate on Insulator PICs for Metrological Applications

被引：0
|
作者：
Obrzud, Ewelina [1 ]
Sattari, Hamed [1 ]
Voumard, Thibault [2 ]
Choong, Gregory [1 ]
Denis, Severine [1 ]
Leo, Jacopo [1 ]
Wildi, Thibault [2 ]
Dubochet, Olivier [1 ]
Despont, Michel [1 ]
Lecomte, Steve [1 ]
Herr, Tobias [2 ]
Ghadimi, Amir [1 ]
Brasch, Victor [1 ]
机构：
[1] CSEM Swiss Ctr Elect & Microtechnol, CH-2000 Neuchatel, Switzerland
[2] DESY, CFEL Ctr Free Electron Laser Sci, D-22607 Hamburg, Germany
来源：
2021 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC) | 2021年
关键词：
D O I：
10.1109/CLEO/Europe-EQEC52157.2021.9541590
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：1
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