Single event upset rate of 140 Mb/s pixel-data serializer

被引：1

作者：

Chiodini, G

Appel, JA

Cardoso, G

Christian, DC

Hall, B

Hoff, J

Kwan, SW

Mekkaoui, A

Moroni, L

Uplegger, L

Zimmermann, S

机构：

[1] Ist Nazl Fis Nucl, I-73100 Lecce, Italy

[2] Fermilab Natl Accelerator Lab, Batavia, IL 60510 USA

[3] Ist Nazl Fis Nucl, I-20133 Milan, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2004年 / 518卷 / 1-2期

关键词：

pixel; readout chip; serializer; single event upset; proton irradiation;

D O I：

10.1016/j.nima.2003.11.070

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report on high-dose irradiation studies performed with a 200 MeV proton beam on a 140 Mbit/s pixel-data serializer prototype realized in standard 0.25 mum CMOS technology. The data serializer was implemented recently for the BTeV pixel readout chip developed at Fermilab. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：507 / 508

页数：2

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