Optimized structures of multilayer soft X-ray reflectors in the spectral range of 30 to 300 Å

被引:16
|
作者
Kim, DE [1 ]
Cha, DH [1 ]
Lee, SW [1 ]
机构
[1] Pohang Univ Sci & Technol, Dept Phys, Pohang 790784, Kyungbuk, South Korea
关键词
thin film; multilayer; reflectivity; soft X-ray reflectors; X-ray laser; X-ray scattering;
D O I
10.1143/JJAP.37.2728
中图分类号
O59 [应用物理学];
学科分类号
摘要
For wavelengths in the spectral range of 30 to 300 Angstrom, the structures of multilayer (ML) soft X-ray reflectors for maximum reflectivity at normal incidence were optimized. A dynamical theory of X-ray scattering was employed in the calculation for ideal ML structures. The calculation indicates that the optimization should be performed for a sufficiently large number of bilayers. The structural parameters optimized for a small number of bilayers do not yield the best performance. It is also observed that for a given number of bilayers, there exists a range of structural parameters for equivalent performance. In the spectral region considered, the maximum reflectivities vary from 40 to 78% with respect to wavelength.
引用
收藏
页码:2728 / 2733
页数:6
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