A PROGRAMMING FRAMEWORK OF CONCURRENT TEST ON SMT7 FOR IPS WHICH SHARE SAME ACCESS PORT

With the development of the microelectronic technique, SOC integrates dozens or even hundreds of IP, which brings long test time and also significant test costs. This paper proposes a new method of concurrent testing using wait time of BIST of each IPs which share same access port. Meanwhile, this paper designs a software framework to implement the concurrent test rapidly and keep maintenance of test methods convenient. In this framework, test method need be divided into a set of functions marked by related type. Actions which could be run parallel is packed into these functions, then these functions are run serially at first, test time of each one will be recorded by the framework. Finally, the framework will call these functions according to their type and test time to implement concurrent test. The actual result show that more than 90% concurrent test efficiency was achieved on a 2 IP device which share same access port based on this framework.