Is Test Power Reduction Through X-Filling Good Enough?

被引：0

作者：

Wu, F. ^{[1
]}

Dilillo, L. ^{[1
]}

Bosio, A. ^{[1
]}

Girard, P. ^{[1
]}

Pravossoudovitch, S. ^{[1
]}

Virazel, A. ^{[1
]}

Tehranipoor, M. ^{[2
]}

Miyase, K. ^{[3
]}

Wen, X. ^{[3
]}

Ahmed, N. ^{[4
]}

机构：

[1] Univ Montpellier 2, CNRS, LIRMM, Montpellier, France

[2] Univ Connecticut, Storrs, CT 06268 USA

[3] Kyushu Inst Technol, Fukuoka, Japan

[4] Texas Instruments Inc, Dallas, TX 75243 USA

来源：

INTERNATIONAL TEST CONFERENCE 2010 | 2010年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This study investigates the reasons why test power reduction through X-filling techniques works well for cycle-average power reduction but is not so efficient concerning instantaneous peak power reduction.

引用

页数：1

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