Measurement of lithium diffusion coefficient in thin metallic multilayer by neutron depth profiling

被引:1
|
作者
Ceccio, Giovanni [1 ]
Vacik, Jiri [1 ]
Horak, Pavel [1 ]
Cannavo, Antonino [1 ]
Hnatowicz, Vladimir [1 ]
机构
[1] Czech Acad Sci, NPI, Prague 25068, Czech Republic
关键词
copper; lead; lithium; lithium-ion batteries; multilayers; thermal neutrons; ELECTRODE; CELL;
D O I
10.1002/sia.6826
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Diffusion of Li ions in thin sandwich films with copper or lead encompassing layers (obtained by ion beam sputtering deposition technique) has been studied. These metals are promising candidates for electrodes in lithium-ion batteries. It is because they exhibit an ability to store and release Li ions during charging and discharging processes. Lithium diffusion was induced in samples by thermal annealing cycles. The lithium depth profile was measured using a nondestructive neutron depth profiling technique after each thermal annealing step. The analysis of experimental data allowed to evaluate the lithium depth profiles and directly calculate the diffusion coefficients.
引用
收藏
页码:939 / 942
页数:4
相关论文
共 50 条
  • [1] Diffusion of Lithium in Thin Copper Measured by Neutron Depth Profiling
    Ceccio, Giovanni
    Cannavo, Antonino
    Vacik, Jiri
    Horak, Pavel
    Hnatowicz, Vladimir
    Tomandl, Ivo
    Lavrentiev, Vasyl
    JOURNAL OF PHYSICAL CHEMISTRY C, 2020, 124 (47): : 25748 - 25753
  • [2] Analysis of lithium transport in electrochromic multilayer films by neutron depth profiling
    Lamaze, GP
    Chen-Mayer, HH
    Gerouki, A
    Goldner, RB
    SURFACE AND INTERFACE ANALYSIS, 2000, 29 (09) : 638 - 642
  • [3] Measurement of Li diffusion in porous carbon by neutron depth profiling
    Ceccio, G.
    Cannavo, A.
    Horak, P.
    Torrisi, A.
    Tomandl, I.
    Hnatowicz, V.
    Tsai, H. S.
    Vacik, J.
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2018, 173 (9-10): : 836 - 841
  • [4] In situ measurement of lithium movement in thin film electrochromic coatings using cold neutron depth profiling
    Lamaze, GP
    Chen-Mayer, H
    Badding, M
    Laby, L
    SURFACE AND INTERFACE ANALYSIS, 1999, 27 (07) : 644 - 647
  • [5] DIFFUSION OF LI-6 ISOTOPES IN LITHIUM ALUMINATE CERAMICS USING NEUTRON DEPTH PROFILING
    MCWHINNEY, HG
    JAMES, WD
    SCHWEIKERT, EA
    WILLIAMS, JR
    HOLLENBERG, G
    WELSH, J
    SEREATAN, W
    JOURNAL OF NUCLEAR MATERIALS, 1993, 203 (01) : 43 - 49
  • [6] 3He thermal diffusion coefficient measurement in crystalline ceramics by μnra depth profiling
    Trocellier, P
    Gosset, D
    Simeone, D
    Costantini, JM
    Deschanels, X
    Roudil, D
    Serruys, Y
    Grynszpan, R
    Saudé, S
    Beauvy, M
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 210 : 507 - 512
  • [7] A speckle-photometry method of measurement of thermal diffusion coefficient of thin multilayer and nanoporous structures
    Mukhurov, Nikolai I.
    Khilo, Nikolay A.
    Maschenko, Alexander G.
    SPECKLE 2010: OPTICAL METROLOGY, 2010, 7387
  • [8] Measurement of the Diffusion Coefficient of Lithium in Tin Thin Films Including Phase Transformation Effects
    Fok, Eddie C. W.
    Madden, John D. W.
    ENERGY TECHNOLOGY/BATTERY (GENERAL) - 223RD ECS MEETING, 2013, 53 (30): : 131 - 142
  • [9] Electrochemical depth profiling of multilayer metallic structures: An aluminum brazing sheet
    Afshar, F. Norouzi
    Ambat, R.
    Kwakernaak, C.
    de Wit, J. H. W.
    Mol, J. M. C.
    Terryn, H.
    ELECTROCHIMICA ACTA, 2012, 77 : 285 - 293
  • [10] Magnetic depth profiling of Fe/Au multilayer using neutron reflectometry
    Singh, Surendra
    Basu, Saibal
    Gupta, M.
    PRAMANA-JOURNAL OF PHYSICS, 2008, 71 (05): : 1103 - 1107