Topological protection versus degree of entanglement of two-photon light

被引：0
|
作者：
Tschernig, Konrad [1 ]
Busch, Kurt
Perez-Leija, Armando
机构：
[1] Max Born Inst, Max Born Str 2A, D-12489 Berlin, Germany
来源：
2021 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC) | 2021年
关键词：
D O I：
10.1109/CLEO/Europe-EQEC52157.2021.9541860
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页数：1
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