Optimization of the specific on-resistance of the COOLMOS™

被引:0
|
作者
Chen, XB [1 ]
Sin, JKO
机构
[1] Univ Elect Sci & Technol China, Dept Elect Engn, Sichuan 610054, Peoples R China
[2] Hong Kong Univ Sci & Technol, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China
关键词
charge compensation; COOLMOS; on-resistance; power transistor; VDMOS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The optimized values for the physical and geometrical parameters of the p- and n-regions used in the voltage-sustaining layer of the COOLMOS(TM)(1) are presented. Design of the parameters is aimed to produce the lowest specific on-resistance, R-on, for a given breakdown voltage, V-B. A new relationship between the R-on and V-B for the COOLMOS(TM) is developed as R-on = C.V-B(1.32), where the constant C is dependent on the cell dimension and pattern geometry. It is also found that by putting a thin layer of insulator between the p-region and its neighboring n-regions, the value of R-on can be further reduced. The possibility of incorporating the insulating layer may open up opportunities for practical implementation of the COOLMOS(TM) for volume production.
引用
收藏
页码:344 / 348
页数:5
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