Impedance-matching probes help check wireless circuits

被引：0
|
作者：
Basu, S
Pence, JE
Strid, E
Fennelly, M
机构：
来源：
MICROWAVES & RF | 1996年 / 35卷 / 06期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
MEASUREMENT systems often assume ideal conditions when matching impedances. But impedances are rarely a precise 50 Omega, or even close to that mark. For that reason, it may make sense to perform measurements an high frequency circuits with test probes that can match their impedance to the device under test (DUT). Such probes, which are well-suited for load-pull measurements on wireless circuits, are now available from Cascade Microtech (Beaverton, OR).
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页码：154 / &
页数：3
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