Failure Analysis in Electronics: An EDFAS Special Issue Introduction

被引：0

|

作者：

Knauss, Lee ^{[1
]}

机构：

[1] Booz Allen Hamilton, College Pk, MD 20740 USA

来源：

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | 2011年 / 22卷 / 10期

关键词：

D O I：

10.1007/s10854-011-0515-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1509 / 1510

页数：2

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