Debugging embedded systems: using a serial condition monitor to overcome limited diagnostic access

被引：0
|
作者：
Ball, SR [1 ]
机构：
[1] Organon Teknika, Oklahoma City, OK USA
来源：
EDN | 1998年 / 43卷 / 12期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：167 / 170
页数：4
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