Dual-projector structured light 3D shape measurement

被引:15
|
作者
Yu, Ying [1 ]
Lau, Daniel L. [1 ]
Ruffner, Matthew P. [1 ]
Liu, Kai [2 ]
机构
[1] Univ Kentucky, Dept Elect & Comp Engn, 453 F Paul Anderson Tower, Lexington, KY 40506 USA
[2] Sichuan Univ, Sch Elect Engn & Informat, Shuncheng St 252, Chengdu 610017, Sichuan, Peoples R China
关键词
PHASE-MEASURING-PROFILOMETRY; FRINGE PATTERNS; SCHEME;
D O I
10.1364/AO.378363
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Structured light illumination is an active three-dimensional scanning technique that uses a projector and camera pair to project and capture a series of stripe patterns; however, with a single camera and single projector, structured light scanning has issues associated with scan occlusions, multi-path, and weak signal reflections. To address these issues, this paper proposes dual-projector scanning using a range of projector/camera arrangements. Unlike previous attempts at dual-projector scanning, the proposed scanner drives both light engines simultaneously, using temporal-frequency multiplexing to computationally decouple the projected patterns. Besides presenting the details of how such a system is built, we also present experimental results demonstrating how multiple projectors can be used to (1) minimize occlusions; (2) achieve higher signal-to-noise ratios having twice a single projector's brightness; (3) reduce the number of component video frames required for a scan; and (4) detect multi-path interference. (C) 2020 Optical Society of America
引用
收藏
页码:964 / 974
页数:11
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