Implementation of SMK Test Module with FPGA

被引：0
|
作者：
Ahn, Ji-Young [1 ]
Kwon, Doyune [1 ]
Lim, Dong-Geun [1 ]
Jo, Seo-Young [1 ]
Yu, Seung-Myeong [1 ]
Lee, Yong Heon [2 ]
Song, Junyoung [1 ]
机构：
[1] Incheon Natl Univ, Dept Elect Engn, Incheon, South Korea
[2] DPECO, Sanghaga Ri, Gangwon Do, South Korea
来源：
2021 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS-ASIA (ICCE-ASIA) | 2021年
关键词：
EV; SMK; Test module; FPGA;
D O I：
10.1109/ICCE-Asia53811.2021.9641991
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
Recently, as the demand of electric vehicles (EV) increases, securing the safety of EV has become the issue. The technology for test module that inspects malfunction of components for EV is needed. In this paper, the test module for smart key (SMK), which is one of the components of EV is proposed. Test module consists of SMK, test part, and voltage domain converter (PDC). The codes of SMK and test part are designed based on the measurement results of SAN and verified with simulations. The designed codes for SMK and test part are programmed on two different FPGAs. And, the codes are verified by connecting two FPGAs. The test part is connected with the real SMK instead of the FPGA for SMK to check that SMK meets all operating conditions. The test module proposed in this paper can be applied to other components of EV besides SMK.
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页数：3
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