Advanced three-dimensional packaging technology for high-density CCD micro-camera system module

被引:0
|
作者
Yamada, H [1 ]
Togasaki, T [1 ]
Terui, T [1 ]
Kimura, M [1 ]
Ooi, K [1 ]
Sudo, H [1 ]
机构
[1] Ctr Corp Res & Dev, Display Mat & Devices Lab, Saiwai Ku, Kawasaki, Kanagawa 2108582, Japan
关键词
3D packaging module; CCD micro-camera; sidewall footprint; stacked-unit substrate; flip-chip technology;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Advanced three-dimensional packaging technology for a high-density CCD micro-camera system module has been developed by applying high-density-interconnection stack-unit modules that have fine-pitch flip-chip interconnections within copper-column-based solder bumps and high-aspect-ratio sidewall footprints for vertical interconnections. Copper-column-based solder bump design and underfill encapsulation resin characteristics were optimized to reduce the strain in the bump and to achieve fine-pitch Pip-chip interconnection with high reliability. High-aspect-ratio sidewall footprints were realized by the copper-filled stacked vias at the edge of the module substrate. High-precision distribution of sidewall footprints was achieved by laminating the multiple stack-unit substrates simultaneously. The fabricated three-dimensional package has operated satisfactorily as the CCD imaging data transmission circuit. The technology was confirmed to be effective for incorporating many devices of different sizes at far higher packaging density than it is possible to attain using conventional technology.
引用
收藏
页码:241 / 246
页数:6
相关论文
共 50 条
  • [1] High-density 3D packaging technology for CCD micro-camera system module
    Yamada, H
    Togasaki, T
    Kimura, M
    Sudo, H
    14TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST, 2001, : 14 - 17
  • [2] High-density 3D packaging sidewall interconnection technology for CCD micro-camera visual inspection system
    Yamada, H
    Togasaki, T
    Kimura, M
    Sudo, H
    ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS, 2003, 86 (08): : 67 - 75
  • [3] High-density 3-D packaging technology based on the sidewall interconnection method and its application for CCD micro-camera visual inspection system
    Yamada, H
    Togasaki, T
    Kimura, M
    Sudo, H
    IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2003, 26 (02): : 113 - 121
  • [4] Three-dimensional Measurement Method of Glue Surface During the Mounting Process of Micro-camera Module
    Wu Fupei
    Yu Guanlin
    Le Cong
    Ye Weilin
    Zhu Shukai
    ACTA PHOTONICA SINICA, 2022, 51 (04) : 265 - 274
  • [5] Ultra-high-density interconnection technology of three-dimensional packaging
    Takahashi, K
    Umemoto, M
    Tanaka, N
    Tanida, K
    Nemoto, Y
    Tomita, Y
    Tago, M
    Bonkohara, M
    MICROELECTRONICS RELIABILITY, 2003, 43 (08) : 1267 - 1279
  • [6] HIGH-DENSITY HYBRID MODULE - CHIP AND WIRE TECHNOLOGY IS THE BEST FLEXIBLE APPROACH TO HIGH-DENSITY PACKAGING
    NISHI, Y
    SAITO, T
    TOSHIBA REVIEW, 1981, (136): : 37 - 40
  • [7] Three-Dimensional Printing with Waste High-Density Polyethylene
    Gudadhe, Aniket
    Bachhar, Nirmalya
    Kumar, Anil
    Andrade, Prem
    Kumaraswamy, Guruswamy
    ACS APPLIED POLYMER MATERIALS, 2019, 1 (11): : 3157 - 3164
  • [8] High resolution three-dimensional flash LIDAR system using a polarization modulating Pockels cell and a micro-polarizer CCD camera
    Jo, Sungeun
    Kong, Hong Jin
    Bang, Hyochoong
    Kim, Jae-Wan
    Kim, Jomsool
    Choi, Soungwoong
    OPTICS EXPRESS, 2016, 24 (26): : A1580 - A1585
  • [9] A three-dimensional stacked Fin-CMOS technology for high-density ULSI circuits
    Wu, XS
    Chan, PCH
    Zhang, SD
    Feng, CG
    Chan, M
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (09) : 1998 - 2003
  • [10] Three-Dimensional Integration Approach to High-Density Memory Devices
    Kim, Hojung
    Jeon, Sanghun
    Lee, Myoung-Jae
    Park, Jaechul
    Kang, Sangbeom
    Choi, Hyun-Sik
    Park, Churoo
    Hwang, Hong-Sun
    Kim, Changjung
    Shin, Jaikwang
    Chung, U-In
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011, 58 (11) : 3820 - 3828