Simultaneous determination of the thickness and the dispersion of the dielectric constant of a Langmuir-Blodgett film deposited on a CaF2 plate

被引：3
|
作者：
Ikegami, K [1 ]
机构：
[1] Natl Inst Adv Ind Sci & Technol, AIST Tsukuba Cent 2, Nanotechnol Res Inst, Tsukuba, Ibaraki 3058568, Japan
来源：
THIN SOLID FILMS | 2005年 / 483卷 / 1-2期
关键词：
refractive index; organic thin film; fatty acid; anisotropy; Langmuir-Blodgett film;
D O I：
10.1016/j.tsf.2004.12.060
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A procedure for simultaneous determination of the thickness and the optical dielectric constant of a thin organic film on a transparent substrate has been proposed. With this procedure these physical quantities can be determined from data collected by a conventional ultraviolet-visible spectrometer without depending on any dispersion model of the organic film. The thickness and the dielectric constant (in the wave number range of 3.6 x 10(4)-1.2 x 10(4) cm(-1)) have been determined for 25-layer and 37-layer Langmuir Blodgett films of a calcium arachidate-arachidic acid mixture. The results for these films agree with each other, showing the utility of the proposed procedure. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：312 / 318
页数：7
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