Vernier scales and other early devices for precise measurement

被引:11
|
作者
Kwan, Alistair [1 ]
机构
[1] Yale Univ, Sect Hist Med, New Haven, CT 06520 USA
关键词
D O I
10.1119/1.3533717
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
Vernier scales have been extensively used since the 17th century. They replaced the Nonius scale, a unpopular device due to difficulty in its fabrication and use, and they coexisted alongside other types of scales that increased measurement precision and accuracy in complementary ways. I suggest that the success of Vernier and diagonal scales is due not only to simplicity of fabrication, but also to their exploitation of visual hyperacuities. (C) 2011 American Association of Physics Teachers. [DOI: 10.1119/1.3533717]
引用
收藏
页码:368 / 373
页数:6
相关论文
共 50 条
  • [1] THE USE OF VERNIER SCALES
    COTTON, DWK
    KIRKHAM, N
    HISTOPATHOLOGY, 1991, 19 (06) : 579 - 579
  • [2] ON THE PRECISE MEASUREMENT OF DEFORMATION ON ROTATING DEVICES
    STOPSKII, SB
    INDUSTRIAL LABORATORY, 1959, 25 (06): : 786 - 786
  • [3] VERNIER SCALES FOR DIAMETER TAPES
    YOCOM, HA
    JOURNAL OF FORESTRY, 1970, 68 (11) : 725 - &
  • [4] VERNIER SELF-ADHESIVE SCALES
    不详
    MACHINERY AND PRODUCTION ENGINEERING, 1971, 118 (3056): : 873 - &
  • [5] Precise distance measurement with IEEE 802.15.4 (ZigBee) devices
    Schwarzer, Stefan
    Vossiek, Martin
    Pichler, Markus
    Stelzer, Andreas
    2008 IEEE RADIO AND WIRELESS SYMPOSIUM, VOLS 1 AND 2, 2008, : 779 - +
  • [6] VALIDATION OF THE REALISED MEASUREMENT UNCERTAINTY IN PROCESS OF PRECISE LINE SCALES CALIBRATION
    Medic, Srdan
    Kondic, Zivko
    Runje, Biserka
    TEHNICKI VJESNIK-TECHNICAL GAZETTE, 2012, 19 (02): : 333 - 339
  • [7] Precise delay generation using the Vernier technique
    Department of Electrical Engineering, North Carolina State University, Raleigh, NC 27695-7911, United States
    Electron Lett, 18 (1658-1659):
  • [8] Precise delay generation using the Vernier technique
    Moyer, GC
    Clements, M
    Liu, W
    ELECTRONICS LETTERS, 1996, 32 (18) : 1658 - 1659
  • [9] Evaluation of Verification Devices with Precise Probe Measurement System in NMIJ
    Sakamaki, Ryo
    Horibe, Masahiro
    2016 URSI ASIA-PACIFIC RADIO SCIENCE CONFERENCE (URSI AP-RASC), 2016, : 481 - 482
  • [10] Precise Measurement Techniques for Optical-to-electric Conversion Devices
    Kawanishi, Tetsuya
    Inagaki, Keizo
    Kanno, Atsushi
    Yamamoto, Naokatsu
    2016 PROGRESS IN ELECTROMAGNETICS RESEARCH SYMPOSIUM (PIERS), 2016, : 3906 - 3906