Ionization balance for Ti and Cr ions: effects of uncertainty in dielectronic recombination rate

被引:3
|
作者
Seon, KI
Nam, UW
Park, IH
机构
[1] Korea Astron Observ, Taejon 305348, South Korea
[2] Ewha Womans Univ, Dept Phys, Seoul 120750, South Korea
关键词
D O I
10.1088/0953-4075/36/12/322
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The available electron-impact ionization cross sections for Ti and Cr ions are reviewed, and calculations of the ionization balance for the ions under coronal equilibrium are presented. The calculated ionic abundance fractions are compared with those of previous works. The effects of modelling uncertainty in dielectronic recombination on isoelectronic line ratios, which are formed using the same spectral line from two elements of slightly different atomic numbers, are discussed concentrating on high temperature ranges. Also discussed are the effects of modelling uncertainty on inter-ionization stage line ratios formed from adjacent ionization stages. It is demonstrated that the modelling uncertainty in dielectronic recombination tends to cancel out only when the isoelectronic line ratio of He-like ions is considered, and that the sensitivity of the isoelectronic line ratios to the modelling uncertainty tends to increase for less ionized stages. It is also found that the interstage line ratios are less sensitive to the typical similar to20% uncertainties of dielectronic rates than the isoelectronic line ratios, and that the interstage line ratio of He- to Li-like ions in Ti and Cr plasmas is a better choice for a temperature diagnostic in the temperature ranges from similar to0.6 to similar to1.5 keV in which Li-like ions have maximum ionic abundances.
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页码:2679 / 2694
页数:16
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