Comparative study of structural and optical properties of thermally evaporated and pulsed laser ablated CdSe thin films

被引：0
|
作者：
El-Barry, A. M. A. [1 ]
El-Nahass, M. M. [1 ]
Atta, A. A. [1 ]
机构：
[1] Ain Shams Univ, Thin Film Lab, Dept Phys, Fac Educ, Cairo, Egypt
来源：
OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS | 2007年 / 1卷 / 07期
关键词：
CdSe thin film; Laser ablation technique; optical parameters;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A comparison, of some structural and optical properties for pulsed laser ablated (PLA) and thermally evaporated (TE) CdSe thin films, is given. The stoichiometry of the prepared films is checked by energy dispersive X-ray spectroscopy (EDX). Electron microscope data indicate the polycrystalline nature of the films with hexagonal structure. The degree of crystallinity is improved in PLA films. Some optical parameters for the two groups of CdSe films were compared over a wide range of wavelength (similar to 200-2500 nm) at room temperature. The analysis of the data indicates that the dispersion parameters are affected by the technique of preparation more than the absorption parameters.
引用
收藏
页码：322 / 328
页数：7
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