Experimental and numerical study on structural and thermal radiation properties of yttrium oxide sputtered on sapphire

被引:12
|
作者
He, Yurong [1 ]
Liu, Yuanchun [1 ]
Liu, Xing [2 ]
Zhu, Jiaqi [2 ]
Han, Jiecai [2 ]
机构
[1] Harbin Inst Technol, Sch Energy Sci & Engn, Harbin 150001, Peoples R China
[2] Harbin Inst Technol, Sch Astronaut, Harbin 150001, Peoples R China
基金
中国国家自然科学基金;
关键词
Yttrium oxide; Magnetron sputtering; Structural properties; Thermal radiation properties; Apparent emissivity; NEUTRON-IRRADIATION; ION-IMPLANTATION; ENHANCEMENT; EMISSIVITY; CRYSTALS; STRENGTH; FILMS;
D O I
10.1016/j.jallcom.2014.11.233
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Materials for infrared domes are required to maintain good properties in harsh environments including mechanical strength, optical transmittance over a wide range of wavelengths and low emissivity. The purpose of this work is to sputter Y2O3 film onto a sapphire substrate by a radio frequency magnetron sputtering method and investigate the structural and thermal radiation properties of the films. In addition, the apparent emissivity of the coated sapphire is simulated for different film thicknesses at different temperatures. The experimental results show that the surface of the Y2O3 film is homogeneous, has a dense morphology and is totally polycrystalline. After being coated with the Y2O3 film, the transmission of the sapphire substrate is improved and the emissivity is decreased with increasing film thickness, especially at high temperatures. Simulation results show that apparent emissivity of a sapphire substrate at high temperatures can be reduced effectively by the Y2O3 film when the ratio of the thickness of Y2O3 film and sapphire substrate is larger than 0.01. (C) 2014 Elsevier B. V. All rights reserved.
引用
收藏
页码:438 / 445
页数:8
相关论文
共 50 条
  • [1] Investigation of thermal radiation effect on optical dome of sapphire coated yttrium oxide
    Liu, Yuanchun
    Hua, Zhiwei
    He, Yurong
    Zhu, Jiaqi
    Han, Jiecai
    SCIENCE BULLETIN, 2016, 61 (10) : 801 - 810
  • [2] Experimental study of the effect of yttrium on the structural, thermal, and magnetic properties of BiFeO3
    Maleki, Hamed
    Zakeri, Mahmoud
    Fathi, Reza
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2018, 124 (11):
  • [3] Experimental study of the effect of yttrium on the structural, thermal, and magnetic properties of BiFeO3
    Hamed Maleki
    Mahmoud Zakeri
    Reza Fathi
    Applied Physics A, 2018, 124
  • [4] The tunable dielectric properties of sputtered yttrium oxide films
    Pei Lei
    Xiaoting Chen
    Yue Yan
    Jiaqi Zhu
    Applied Physics A, 2021, 127
  • [5] The tunable dielectric properties of sputtered yttrium oxide films
    Lei, Pei
    Chen, Xiaoting
    Yan, Yue
    Zhu, Jiaqi
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2021, 127 (02):
  • [6] Study of the structural, thermal, optical, electrical and nanomechanical properties of sputtered vanadium oxide smart thin films
    Porwal, Deeksha
    Esther, A. Carmel Mary
    Reddy, I. Neelakanta
    Sridhara, N.
    Yadav, Nagendra Prasad
    Rangappa, Dinesh
    Bera, Parthasarathi
    Anandan, Chinnasamy
    Sharma, Anand Kumar
    Dey, Arjun
    RSC ADVANCES, 2015, 5 (45): : 35737 - 35745
  • [7] Thermal and structural properties of molybdenum systems modified with aluminum, gallium, or yttrium oxide
    N. Ya. Usachev
    I. M. Gerzeliev
    E. P. Belanova
    A. V. Kazakov
    V. P. Kalinin
    V. V. Kharlamov
    S. A. Kanaev
    T. S. Starostina
    Petroleum Chemistry, 2016, 56 : 846 - 851
  • [8] Thermal and structural properties of molybdenum systems modified with aluminum, gallium, or yttrium oxide
    Usachev, N. Ya
    Gerzeliev, I. M.
    Belanova, E. P.
    Kazakov, A. V.
    Kalinin, V. P.
    Kharlamov, V. V.
    Kanaev, S. A.
    Starostina, T. S.
    PETROLEUM CHEMISTRY, 2016, 56 (09) : 846 - 851
  • [9] Study of the structural and electronic properties of magnetron sputtered tin oxide films
    De, Abhijit
    Ray, Swati
    Journal of Physics D: Applied Physics, 1991, 24 (05): : 719 - 726
  • [10] Electrical and structural properties of rapid thermal annealed RF sputtered silicon oxide films
    Microelectronics Laboratory, Department of Electrical Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260, Singapore
    不详
    Thin Solid Films, (108-110):