Elucidating the microwave dielectric properties of (Mg(1-x)Znx)2SnO4 ceramics

被引：19
|
作者：
Chen, Yih-Chien [1 ]
机构：
[1] Lunghwa Univ Sci & Technol, Dept Elect Engn, Gueishan Shiang, Taoyuan County, Taiwan
来源：
JOURNAL OF ALLOYS AND COMPOUNDS | 2012年 / 527卷
关键词：
(Mg0.93Zn0.07)(2)SnO4; X-ray diffraction pattern; Dielectric constant; Quality factor; Temperature coefficient of resonant frequency; CRYSTAL-STRUCTURE;
D O I：
10.1016/j.jallcom.2012.03.015
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The microwave dielectric properties of (Mg(1-x)Znx)(2)SnO4 ceramics were examined with a view to their exploitation for mobile communication. The (Mg(1-x)Znx)(2)SnO4 ceramics were prepared by the conventional solid-state method with various sintering temperatures. The X-ray diffraction patterns of the (Mg0.93Zn0.07)(2)SnO4 ceramics revealed no significant variation of phase with sintering temperatures. Dielectric constant (epsilon(r)) of 8.50, quality factor (Q x f) of 186,100 GHz, and temperature coefficient of resonant frequency (tau(f)) of -61 ppm/degrees C were obtained for (Mg0.93Zn0.07)(2)SnO4 ceramics that were sintered at 1550 degrees C for 4 h. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码：84 / 89
页数：6
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